Infrared Short Course Tentative Schedule
Dates: June 22-26, 2022
*All times listed in Pacific Standard Time
DAY 1 — The Basics
Introduction to Infrared Detection
Alan W. Hoffman
Introduction to the sources, transmission, and detection of infrared radiation. Overview of detector history and current technology trends. Introduction to semiconductor physics and semiconductor structures used in detecting infrared.
12:00pm-12:30pm – Break
Introduction to Infrared Detection (cont.)
DAY 2 — Detectors
Modern Infrared Detectors
Surveys a variety of infrared detectors with an emphasis on application to focal plane arrays (FPAs). Provides an operational description of the various devices followed by a more detailed review of physics of detection and noise processes. Emphasis will be on photovoltaic arrays used in cooled FPAs and microbolometer arrays used in uncooled FPAs. Detailed review of material growth techniques, device architecture, and fabrication processes used in HgCdTe, InSb and VOx detector arrays. Survey of current state-of-the-art in detector array formats and performance. Discussion of key operational parameters that impact detector performance and producibility.
12:00-12:45pm – Break
Infrared Detector Packaging
An introduction to the packaging of infrared detectors. This provides an understanding into the design and fabrication of the environments required for infrared imagery. Specific applications cover ground based, airborne, missile and spacecraft systems and the specific design requirements and materials for these applications. Basic cryogenics, optical interfacing and vacuum processing will be discussed.
DAY 3 — Focal Plane Electronics
Focal Plane Electronics
John L. Vampola
Detector signal preamplifiers, multiplexers and output buffers for multi-element arrays using readout integrated circuits. Theory of operation and application of circuit types. Introduction to "smart" focal planes. Primer on common CMOS processing utilized for infrared focal plane electronics. Effects of ionizing radiation on the performance of CMOS devices and ways to design for radiation-hardened applications. Includes hands-on electronics lab to provide experience in the operation of detector preamplifiers commonly found in infrared focal planes. These amplifiers include CTIA, DI, and SFD.
12:00-12:45pm – Break
12:45-2:00pm – Focal Plane Electronics (continued) – John L. Vampola
DAY 4 — FPA Characterization/Testing and Special Topics
Infrared Detector Testing
John E. Hubbs
The FPA characterization/testing section will review radiometry, optical sources used for characterizing infrared detectors and FPAs, review of detector and FPA characterization methodologies, review of key figures of merit and device specifications such as responsivity, noise equivalent irradiance, D*, and others. Also included will be a review of important test equipment such as Dewars, optical sources, and measurement electronics.
12:00-12:30pm – Break
James Webb Space Telescope: Ready to open the infrared treasure chest?
Dr. John Mather, Nobel Laureate
With the James Webb Space Telescope (JWST), NASA is ready to launch the largest, most sensitive infrared telescope ever deployed in space. Dr. Mather will describe the capabilities of this astronomical observatory and the new scientific discoveries it may uncover.
IR Equipment Demonstrations - TBA
DAY 5 — Systems
Introduction to Infrared Systems
Terrence S. Lomheim
General infrared applications; IR camera/instrument designs panchromatic, multispectral and hyperspectral sensors, deployment modes, and system implementations; IR camera/instrument performance metrics (NEDT, NEDp, NESR, NET, MTF, etc.) and design trades; review of available IR focal plane technologies and their associated performance; IR focal plane utilization; system applications and system drivers; flowdown of system sensitivity and constraints to focal plane NEI and reference irradiance and dynamic range, including a detailed multispectral example.
12:00-12:30pm – Break
12:30-2:30pm – Introduction to Infrared Systems (continued)
Course Evaluation and Test for Credit (Optional)
Course offers 3 units of professional-level credit (credit is optional). If you wish to receive a grade for this course, a test will be administered 2:30-3:00pm; otherwise, class ends at 2:30pm.